注:国家科技重大专项课题(No. 2017ZX06004004);
国家科技重大专项课题(No. 2019ZX06002020);
重庆市重点研发计划(No. cstc2017zdcy-zdyfX0079);
国机集团重大科技专项项目(No. SINOMAST-ZDZX-2019-03)
作者:张立新1,2,胡轶1,2,王华1,2,鞠华1,2,陈洁1,2,谭俊1,2
单位:1. 重庆材料研究院有限公司,重庆 400707;
2. 国家仪表功能材料工程技术研究中心,重庆 400707
中图分类号:TH811
文献标识码:A
文章编号:1006-883X(2020)07-0007-05
收稿日期:2020-05-28
摘要:大型先进压水堆核电站重大专项——核级传感器用特种功能材料及元件自主化研制,其核级铂电阻元件研制已通过了分度、60年寿期加速寿命、上限温度稳定性等试验。但在性能验证过程中出现R0值异常下降的故障现象。本文通过按核级铠装铂电阻抽真空和提高真空度抽真空对故障进行了复现和定位,发现了电阻异常下降的原因为“釉封不严”。由于釉封温度不够,釉与骨架未良好融合,残存微小气路,在真空及充气等工序过程中,微小气路作用于填充粉料,导致感温铂丝与填充粉料相对位置发生改变,产生“并丝”,造成铂电阻元件电阻值大幅下降的异常现象。本文通过采取针对性措施消除了故障,试验验证了故障原因。建议通过适当提高釉封温度以及二次封釉等工艺,解决釉封不严的现象,可避免电阻异常下降的故障,提高了铂电阻元件的可靠性。
关键词:失效分析;铂电阻元件;釉封
The Analysis for Failures Reason of the Platinum Resistance Elements
ZHANG Li-xin1,2, HU Yi1,2, WANG Hua1,2, JU Hua1,2, CHEN Jie1,2, TAN Jun1,2
1. Chongqing Materials Research Institute Co., Ltd., Chongqing 400707, China; 2. National Instrument Functional Materials Engineering Technology Research Center, Chongqing 400707, China
Abstract: In this paper the phenomenon of the R0 decreased abnormally during the development of high quality platinum resistance elements was investigated. It was because of the imperfectly sealed of glaze. During the vacuum and inflation process of the manufacture of platinum resistance elements, the position of the platinum wires and the sealed glaze was changed due to the float of the glaze. That generated a parallel connection of platinum wires and resulted into the large decrease of resistance. Taking appropriate measurement and testing verification, the fault was eliminated.
Key words: failures analysis; platinum resistance elements; sealed of glaze.
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备注:2020年 第26卷 第07期